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News
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Best papers are:
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Mohamed Mohie El-Din, Hassan Mostafa, Hossam Fahmy and Yehea Ismail. Leakage Power Evaluation of FinFET-Based FPGA Cluster Under Threshold Voltage Variation
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Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui and Koen Bertels. Non-Volatile Look-Up Table Based FPGA Implementations
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Hiba Abdelali, Bedira Rachida, Hichem Trabelsi and Ali Gharsallah. Enhanced Performances of Paper-based Substrate Integrated Waveguide (SIW) Antenna for Wireless Sensor Network applications
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Keynote speakers' presentations are now available for download
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Registration is now open
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Notifications for regular papers
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TN CAS contest paper submission deadline:
November 25, 2016
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A set of
best papers will be
considered for
IEEE Design &
Test
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One proposal for
Plenary Talk
has been accepted
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Two proposals for
Tutorials
have been accepted
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Five proposals for
Special
Sessions
have been accepted
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The IDT 2016 conference will be held
at the
Africana ★★★★★
hotel in the city of Yasmine
Hammamet
The
International Design and Test Symposium
is an IEEE
technically co-sponsored event devoted to
exploring emerging challenges and new
concepts related to the design, test,
automation, and reliability of electronic
systems ranging from integrated circuits
through multi-chip modules and printed
circuit boards to full systems. IDT is a
unique forum to discuss best practices and
novel ideas in design methods, tools, test,
and reliability held in the Middle East and
Africa (MEA) region. The Symposium is
initiating in affiliation with the IEEE TTTC
(Test Technology Technical Council) and the
2016 edition is organized and sponsored by
CES Laboratory and the University of Sfax.
It is also technically co-sponsored by IEEE
CEDA (Council on Electronic Design
Automation). The official language of the
conference is English. Topics of interest
include but are not limited to:
Design Methods and Tools
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Test and Reliability |
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IP and SOC Design
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Multiprocessor/Multi-core Systems
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Embedded Systems
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DFX
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Analog, Mixed Signal and RF Design
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High Speed Circuits Design
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Design of MEMS and MOEMS
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Low Voltage and Low Power system
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Innovative Technologies
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IoT design
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Simulation, Validation &
Verification
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System Specification and Modeling
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Formal Methods and Verification
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System Design/Synthesis/Optimization
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Yield Optimization
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IP and SOC Testing
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Multiprocessor/Multi-Core Systems
Test
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Memory & FPGA Test & Repair
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Automotive reliability & test
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High Speed, Analog, Mixed Signal &
RF Testing
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MEMS/MOEMS Testing
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Defect and Fault Modeling
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DFT, BIST and BISR
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On-line Testing / Fault Tolerance
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Fault Simulation, ATPG
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Reliability Failures/ Modeling
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Circuit Reliability
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Electronic System Reliability
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Regular Submissions:
IDT 2016 invites original, unpublished paper
submissions. Paper submissions should be
complete manuscripts, not exceeding six
pages (inclusive of figures, tables, and
bibliography) in a standard IEEE two-column
format. Authors should clearly explain the
significance of the work, highlight novel
features and describe its current status.
All submissions are to be made
electronically through the IDT 2016 website.
Detailed
instructions for submissions are to be found
at the IDT 2016 website. A submission will
be considered as evidence that,
upon acceptance, the author(s) will prepare
the final camera-ready version of the paper
in time for inclusion in the proceedings,
and will present the paper at the
conference. All papers will be taken into
consideration for the IDT
2016 Best Paper Award.
In addition, a set of best papers will be
considered for IEEE Design & Test.
Special Session proposals:
IDT 2016 solicits Special Sessions, such as
(a) Hot-Topic session addressing and
discussing the challenges in topics of
interest to the symposium, (b) Embedded
tutorials introducing and discussing topics
of interest to the attendees, (c) Panels
discussing visionary and/or controversial
issues. Special Session proposals consist of
an extended summary (up to 1500 words) as
PDF file, describing the session content and
format, and must be submitted electronically
through the IDT 2016 website.
Publications:
IDT 2016 will produce a Formal Proceedings
of accepted papers, published under
IEEEXplore. The proceedings will be
available to all participants during the
symposium
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IMPORTANT
DATES
Regular Paper submission: November 3, 2016
Extended
Special sessions and tutorials proposals: October
31, 2016
Notification of acceptance: November 22, 2016
Deadline
for Paper Inclusion in Workshop Digest: December
4, 2016
GENERAL CHAIRS
Mohamed Abid:
CES Laboratory, University of Sfax, Tunisia
Yervant Zorian: Synopsys (USA)
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Important Dates
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November 3, 2016
Regular Paper
Submission
- November
23, 2016
Acceptance Notification
- December
4, 2016
Final Submission and Registration
- December
18-20:
IDT 2016
Africana ★★★★★
Yasmine Hammamet
Tunisia
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